PANEL DISCUSSION - IN-SITU MONITORING
“In-Situ Monitoring and Process Control in AM: Challenges and Opportunities”
1:30 PM PST
Moderator: Abdalla Nassar, Penn State University
Panelists:
- Darren Beckett, Sigma Labs
- Jared Blecher, 3D Sytems
- Alex Kitt, EWI
- Rashid Miraj, AlphaStar
- Scott Nelson, Rolls Royce